On Wednesday, September 18, a workshop will take place at the Department of Physics, Faculty of Electrical Engineering, CTU, as part of the international TACOM project (supported by TAČR). The event will bring together project participants, including researchers from the Czech Technical University in Prague and the Korea Institute of Science and Technology (KIST), who are working on the development and testing of the technology, as well as the Brno-based company Nenovision, which is developing the device for the global market. The aim of the workshop is to discuss development, share knowledge, and support collaboration on the integration of Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) to improve imaging and measurement capabilities at the nanoscale. As a part of the workshop, the KIST foreign team will visit the Correlative Microscopy Reference Laboratory at the Department of Physics. This technology has the potential for various applications, from material and natural sciences, energy conversion and storage, to the semiconductor industry.